Facilities

Facilities

Surface Analysis

  1. Residual Gas Analyser (RGA)

    2. There are three Residual Gas Analysis (RGA) systems in our laboratory, and they are setup to provide outgassing data of VIG prototypes, component materials, and VIG commercial product. The systems are arranged to meet individual requirements and are based on standard gas analysis procedures. Each system is equipped with an ultra-high vacuum system and calibration. Using methods of fast exposure/aging, data of outgassing that represents months to years of exposure can be readily obtained.

  2. X-ray Photoelectron Spectroscopy (XPS)

    SPECS XPS is equiped with XR 50 X-ray source, Focus 500 Monochromator and PHOIBOS 150 MCD hemispherical analyzer. XPS provides analysis of chemical composition of about 10 nm surface layer with up to 0.1 atomic % sensitivity.

  3. Ellipsometry

    Woollam M-2000-D ellipsometer measures amplitude and phase of light reflected from a sample surface. WVASE32 software allows to analyse real and imaginary parts of refractive index and calculate dielectric constants and thin film thickness. The spectral range of M-2000-D is 193 nm - 1000 nm. Beam diameter is 2 mm.

    Woolam Infrared Variable Angle Spectral Ellipsometer, IR-VASE is capable of measuring both ellipsometry and intensity data in reflection and transmission mode. The spectral range of 1.7 um - 30 um (333 cm-1 - 5900 cm -1). The user-specified resolution is from 1 cm-1 to 64 cm-1. Angle of Incidence is 32o - 90o. IR-VASE is equiped with Heat Stage. Temperature range if from room temperature to 300 oC. Sample size is up to 50 mm diameter and 7.6 mm thick.

  4. UV-Visible Near Infrared (NIR) Spectrophotometry

    UV-Vis NIR dual-beam spectrophotometer Cary 5E measures reflected and transmitted light in 200 nm - 2600 nm wavelength range. The spectrophotometer is equiped with a V-W reflectance accessory. The sample size is approximately 10 mm x 10 mm.

  5. Optical Microscopy

    6. Industrial optical microscope Olympus BX53M for materials applications mantains brightfield (reflected and transmitted light), darkfield, fluorecsence, polarized light and differential interference contrast methods. Our BX53M microscope is equiped with DP74 High resolution Color digital camera and a motorized 3D stage and focus allowing fast and simple analysis of defects in large samples. BX53M has five objectives MPLFN5X BDP NA 0.13 WD 12 mm, MPLFN10X BDP NA 0.25 WD 6.5 mm, MPLFN20X BDP NA 0.4 WD 3 mm, LMPLFLN50X BD NA 0.5 WD 10.6 mm and LMPLFLN100X BD NA 0.8 WD 3.3 mm.

  6. Scanning Electron Microscope (SEM)

    7. The Scanning Electron Microscope is available for high resolution surface analysis of materials. There is also the possibility of bulk properties analysis via X-Ray exposure and bulk structure analysis using ion beam etching to expose areas of interest.

  7. Profilometry

    8. Dektak XTL stylus profiler (Bruker) provides accurate and reproducible measurements of thin film thickness, stress and surface roughness for samples up to 350 mm x 350 mm. The vertical resolution is approximately 1 nm.

Failure Testing

  1. Point Load

    2. Single glass plates or VIG units are placed on a frame. At a point of interest on the glass surface a load point is placed and a predefined static load is applied. Using attachments such as laser displacement sensors, strain gauges and load cells, the bending of the unit, the stress on the glass panes, and the applied load, are data logged to a high degree of accuracy over short and long times.

  2. Surface/Wind Load

    3. Single glass plates or VIG units are placed on a frame. Over the surface of the unit a uniform surface pressure is applied as a predefined static or cyclic load. Using attachments such as laser displacement sensors, strain gauges and load cells, the bending of the unit, the stress on the glass panes, and the applied load, are data logged to a high degree of accuracy over short and long times.

  3. Thermal Load. HotBox Configuration

    4. IGU or VIG unit is framed into a central holder, where the framing includes a section of what would be wall material. Units are setup with laser displacement sensors, strain gauges and thermocouples to data log, the bending of the unit, the stress on the glass panes, and the surface temperatures. On either side of the framed unit a large enclosed box is positioned, air tight, to apply a temperature; on the cold side down to -35 oC and on the hot side as high as 200 oC. This allows for standard hot box testing and also destructive thermal load testing.

  4. Impact Load

    5. Single sheets, IGU or VIG units are placed on a frame in a horizontal or vertical orientation. Either the setup will use a drop-ball configuration or a bag/twin tyre pendulum configuration to apply a time-dependent impact load. High speed imaging (as high as 1 million frames per second) laser displacement sensors, strain gauges and accelerometers are used to image fracture processes, and data log, the bending of the unit, the stress on the glass panes, and the surface forces on impact.

  5. FEM Simulation Methods

    6. When it is required there are high performance computing resources available to perform well defined and validated numerical simulations of the thermos-mechanical properties of the VIG and IGU systems. These will include all of the physics involved down to the micro-scale, and allow standards testing to be used in an iterative design process to always look at optimising the prototype concept or product lifetime.

Individual Pillar Testing of Thermal and Mechanical Properties

Using a unique compression setup with a shear force lever, the mechanical properties of a single pillar is readily measured. This includes, compressive strength, deformation characteristics, contact friction, shear strength, and the normal and lateral compliance of the pillar. All the load data including visual imaging of the measurement process is logged during the tests. In addition, the use of a small guarded hot plate setup allows for the measurement of the thermal conductance of the pillar.

Low-E Coated Glass Measurements

Typically, the optical properties of a LowE coating is measured using our in-house photospectrometer, which can be used within the spectral range of 180 to 5500 nm. In addition, using a series of thermal measurements the exact emissivity of the coating can be measured at various temperatures and after exposure to other environmental conditions. This includes performing the measurement on coated glass which is In a VIG product.

U-value Assesment

The thermal assessment of a VIG unit is performed primarily using our in-house guarded hot plate apparatus. Unlike other equipment of similar type, our system does not reply on temperature measurements, it uses a unique heat loss metering piece that allows for the direct measurement of the power through-put of a sample. This can be coupled with a measurement in the HotBox apparatus to precisely determine the U-value of the glazing and/or the glazing+frame system.

Direct VIG Product Outgassing Measurements

Outgassing is a critical issue in the design and production of a VIG unit. Using a set of Residual Gas Analyser setups, the facility at the University of Sydney allows for the outgassing measurements of the VIG unit, as well as characterising individual components. Moreover, actual VIG product can be tested for vacuum stability and measurements of the outgassing material can be identified.

Long Term Vacuum Stability Measurements

Using a combination of VIG product measurements and the incorporation of particular VIG prototype samples, the long term vacuum stability of a VIG design can be measured. This includes aging of the VIG sample and/or monitoring of product over extended periods, to characterise the potential undesirable pressure increase in the vacuum cavity of the VIG.

Noise Insulation Measurements

Typical reverb-room sound transmission loss measurements can be performed on VIG product. Using the prototyping facility of the VIG Lab, further data on transmission loss can be obtained where the effects of components and other factors can be included. These tests are performed to existing standards as defined in Europe and Nth America.

Hot-box Thermal Load Apparatus for Thermal Measurements and Destructive Thermal Testing

As used in the defined standards for existing glazing systems, a HotBox instrument is used to measure the thermal transmittance of a VIG+frame system. The measurements are performed to existing standards as defined in the EU and Nth America. Unlike other similar systems, our system also allows for destructive testing of the VIG unit to determine directly the potential failure process of the unit. Using a set of high speed cameras and other instruments, the failure process can be accurately characterised.

Solder Glass and Other Materials Components Production and Testing

Variability in the facilities and the connection to other University facilities allows for a wider possibility in testing. This includes the analysis of bulk properties and the measurement of macroscopic mechanical and thermal properties. There is the potential to tailor the existing measurement setups to obtain data on almost all potential materials and design options when it directly concerns the properties of a VIG unit. This is always directly coupled with the endless capabilities of the numerical simulation facilities available.